Defect Metrology Engineer

Intel Intel · Semiconductors · Oregon, Hillsboro, United States +2

This role focuses on advancing semiconductor process technology by identifying root causes of yield limiters, performing statistical analysis, developing methodologies for data consolidation and analysis, and transforming data into actionable insights to improve yield. The engineer will design measurement recipes, collaborate with cross-functional teams to debug yield issues, and ensure manufacturability. The role requires a strong background in statistical analysis, data visualization, and semiconductor process development.

What you'd actually do

  1. Identify root cause yield limiters throughout the lifecycle of a technology node and develop solutions to address them
  2. Perform statistical analysis and create visualizations to construct accurate process development roadmaps that drive technology yield milestones
  3. Develop methodologies to consolidate and analyze data from diverse sources, enabling defect mode understanding and yield modeling
  4. Transform experimental and manufacturing data into actionable insights that improve yield by leveraging advanced statistics, coding techniques, and engineering expertise.
  5. Design and implement measurement recipes to deliver quick, precise feedback on product integrity and resolve yield-impacting issues

Skills

Required

  • Bachelor’s degree or higher degree in a relevant field such as Electrical Engineering, Materials Science, Mechanical Engineering, Semiconductor Technology, or a closely related discipline
  • 6+ years of experience with a Bachelor's degree OR 4+ years of experience with a Master's degree OR 2+ years of experience with a PhD in yield development, process technology, or a related field.
  • Proficiency in statistical analysis and data visualization tools
  • Strong record of collaborative success
  • Strong problem-solving and communication skills
  • Demonstrated experience in cross-functional teamwork and collaboration
  • Proven ability to manage and execute multiple projects simultaneously, meeting tight deadlines without compromising quality

Nice to have

  • Technical expertise in semiconductor process development, defect density analysis, and data analytics
  • Experience with advanced semiconductor equipment and methodologies for process improvement
  • Experience with Defect Metrology
  • Experience working with brightfield, darkfield, and ebeam inspection
  • Experience working with semiconductor factories
  • Experience with failure analysis
  • Familiarity with machine learning approaches and their application in defect detection and yield modeling

What the JD emphasized

  • relevant field such as Electrical Engineering, Materials Science, Mechanical Engineering, Semiconductor Technology, or a closely related discipline
  • yield development, process technology, or a related field
  • statistical analysis and data visualization tools
  • semiconductor process development, defect density analysis, and data analytics
  • Defect Metrology
  • semiconductor factories
  • failure analysis
  • machine learning approaches and their application in defect detection and yield modeling