Design for Test (dft) / Dfx Methodology and Architecture Lead

AMD AMD · Semiconductors · Santa Clara, CA · Engineering

AMD is seeking a Design For Test (DFT) / DFx Methodology and Architecture Lead to support high-speed SerDes PHYs, next-generation Memory PHYs, and die-to-die interconnect IPs. The role involves owning and driving DFT/DFx architecture definition, RTL implementation, methodology development, scan integration support, test constraints, ATPG support, and post-silicon debug for advanced PHY and connectivity IP designs. The candidate will work closely with various engineering teams to deliver robust, high-coverage, production-ready IP.

What you'd actually do

  1. Define and lead PHY-specific DFT/DFx architecture and methodology for high-speed SerDes, Memory PHY, and die-to-die interconnect IPs.
  2. Implement DFT/DFx features in RTL using Verilog/SystemVerilog.
  3. Develop and support DFT micro-architecture, including scan architecture, test modes, clocking, reset, isolation, bypass, and observability features.
  4. Support JTAG/IJTAG, ICL/PDL, scan compression, at-speed scan, and hierarchical DFT implementation.
  5. Support Siemens Tessent-based or equivalent industry-standard DFT flows for ATPG, pattern generation, pattern validation, and debug.

Skills

Required

  • Verilog/SystemVerilog
  • RTL coding
  • DFT/DFx architecture
  • DFT micro-architecture
  • scan architecture
  • test modes
  • clocking
  • reset
  • isolation
  • bypass
  • observability features
  • JTAG/IJTAG
  • ICL/PDL
  • scan compression
  • at-speed scan
  • hierarchical DFT
  • Siemens Tessent
  • ATPG
  • pattern generation
  • pattern validation
  • debug
  • gate-level simulation
  • Synopsys VCS
  • Verdi
  • SpyGlass
  • lint/DFT-readiness analysis
  • MBIST
  • DFT timing constraints
  • test-mode constraints
  • integration guidelines
  • physical design flows
  • problem-solving skills
  • attention to detail
  • technical leadership

Nice to have

  • Tcl
  • Python
  • Perl
  • shell scripting
  • high-speed PHYs
  • SerDes
  • Memory PHYs
  • die-to-die interconnects
  • mixed-signal-adjacent digital IPs
  • physical-design impacts of DFT
  • scan routing
  • test clocking
  • timing closure
  • fault campaigns
  • safety-oriented test methodology
  • functional safety flows
  • pattern retargeting
  • pattern validation
  • tester bring-up
  • production pattern debug
  • post-silicon diagnosis
  • failure analysis
  • yield learning
  • tester-based debug
  • low-power design concepts
  • power gating
  • multi-voltage domains
  • multi-Vt usage
  • retention
  • voltage scaling
  • high-performance digital design
  • low-power digital design fundamentals
  • fault models
  • stuck-at
  • transition
  • path delay
  • gate-exhaustive
  • IDDQ
  • cell-aware fault models
  • hierarchical DFT flows for complex SoCs
  • reusable IPs