Senior Test Engineer

Microsoft Microsoft · Big Tech · Hillsboro, OR +4 · Silicon Engineering

Senior Test Engineer role focused on scan (structural) test for semiconductor IC development, including ATE test program development, bring-up, validation, and yield analysis. Collaborates with design, DFT, and manufacturing teams to ensure test readiness and issue resolution for logic defects. Exposure to product domains like HPC, AI, and GPUs is mentioned.

What you'd actually do

  1. Responsible for product and engineering activities supporting new product development and manufacturing, with primary focus on scan (structural) test.
  2. Contribute to silicon bring-up, validation, and manufacturing readiness while working closely with cross-functional partners.
  3. Support semiconductor IC development across fabrication, manufacturing test, and packaging phases.
  4. Contribute to ATE test program development, including scan pattern integration, test method implementation, bring-up, silicon characterization, debug, and yield analysis for logic defects.
  5. Execute defined test plans and methodologies while identifying issues and escalating risks with clear technical data.

Skills

Required

  • Doctorate in Electrical Engineering, Computer Engineering, Computer Science, or related field AND 1+ year(s) technical engineering experience OR Master's Degree in Electrical Engineering, Computer Engineering, Computer Science, or related field AND 4+ years technical engineering experience OR Bachelor's Degree in Electrical Engineering, Computer Engineering, Computer Science, or related field AND 5+ years technical engineering experience OR equivalent experience.
  • Ability to meet Microsoft, customer and/or government security screening requirements
  • Microsoft Cloud Background Check
  • export control regulations knowledge
  • citizenship verification

Nice to have

  • 5+ years of experience in integrated circuit development, including pre-silicon, first silicon bring-up, or new product introduction.
  • 5+ years of experience in product and test engineering, with hands-on exposure to ATE test program development, bring-up, and debug for scan.
  • Experience working on complex SoCs or chips, including exposure to high-performance, AI, or advanced-node designs.
  • Clear written and verba

What the JD emphasized

  • scan (structural) test
  • ATE test program development
  • silicon bring-up
  • manufacturing readiness
  • yield analysis
  • Design-for-Test (DFT)
  • scan architecture
  • ATPG
  • fault models
  • silicon fabrication processes
  • product qualification
  • reliability
  • transistor theory
  • scan test readiness
  • coverage closure
  • issue resolution
  • high-performance computing
  • AI
  • GPUs
  • telecom
  • scan (SAF/TDF)
  • JTAG
  • boundary scan
  • at-speed testing
  • scan test content generation
  • ATPG pattern validation
  • pattern bring-up
  • post-silicon debug
  • scan fault models
  • stuck-at and transition faults
  • coverage targets
  • defect screening methodologies
  • scan diagnosis tools
  • failure analysis
  • defect locations
  • yield improvement activities
  • simulation
  • emulation
  • pattern verification
  • scan test validation
  • Doctorate in Electrical Engineering, Computer Engineering, Computer Science, or related field AND 1+ year(s) technical engineering experience OR Master's Degree in Electrical Engineering, Computer Engineering, Computer Science, or related field AND 4+ years technical engineering experience OR Bachelor's Degree in Electrical Engineering, Computer Engineering, Computer Science, or related field AND 5+ years technical engineering experience OR equivalent experience.
  • Ability to meet Microsoft, customer and/or government security screening requirements are required for this role.
  • Microsoft Cloud Background Check
  • export control regulations
  • International Traffic in Arms Regulations
  • Export Administration Regulations
  • EU Dual Use Regulation
  • successful candidate will be required to provide either proof of their country of citizenship or proof of their US. residency or other protected status
  • successful candidate’s citizenship will be verified with a valid passport.
  • integrated circuit development
  • pre-silicon
  • first silicon bring-up
  • new product introduction
  • product and test engineering
  • ATE test program development
  • bring-up
  • debug for scan
  • complex SoCs or chips
  • high-performance
  • AI
  • advanced-node designs