Wla Yield Defect Metrology Engineer - Shift 7

Intel Intel · Semiconductors · Oregon, Hillsboro, United States

This role focuses on yield enhancement in semiconductor manufacturing by applying statistical analysis, machine learning, and data analytics to identify root causes of yield limiters and optimize manufacturing processes. The engineer will extract insights from diverse data sources, develop tools for high-volume data analysis, and collaborate with cross-functional teams to drive process improvements and ensure product quality.

What you'd actually do

  1. Conduct statistical analysis and visualizations to identify yield limiters and construct detailed process roadmaps.
  2. Extract insights from structured and unstructured data using statistical methods, machine learning, and coding techniques.
  3. Organize and interpret fab process, defect, and process/equipment data to detect anomalies and drive process changes for yield improvement.
  4. Develop tools and multivariate algorithms to perform high-volume data analysis, enabling accurate yield Pareto construction.
  5. Execute data-driven design of experiments in collaboration with factory task forces to refine processes.

Skills

Required

  • Bachelor's degree in Materials Science and Engineering, Mechanical Engineering, Computer Science, Information Systems, Chemical Engineering, Electrical Engineering, Chemistry, Physics, or another STEM-related field, with 2+ years of relevant metrology experience; OR Master's degree in the above fields and 1+ years of metrology experience.

Nice to have

  • statistical and analytical techniques to yield improvement
  • analytical tools such as JMP, JSL, SQL/SQL Pathfinder
  • Python for data analysis and process modeling
  • defect reduction
  • yield analysis
  • module engineering roles

What the JD emphasized

  • yield improvement
  • yield analysis