Staff, Design for Test Engineer (dft)

Tenstorrent · Semiconductors · Bangalore, India · Silicon

Tenstorrent is seeking a Staff Design for Test (DFT) Engineer for their high-performance AI/ML architectures. The role involves RTL implementation, ATPG, test coverage analysis, JTAG, scan compression, ASST, gate-level simulation, silicon bring-up support, MBIST, and DFx flow development for ASIC designs. Experience with finFET technologies and industry-standard DFx tools is required.

What you'd actually do

  1. Implementation of DFT features into RTL using verilog.
  2. Understanding of DFT Architectures and micro-architectures.
  3. ATPG and test coverage analysis using industry standard tools.
  4. JTAG, Scan Compression, and ASST implementation.
  5. Gate level simulation using Synopsys VCS and Verdi.

Skills

Required

  • BS/MS/PhD in EE/ECE/CE/CS
  • 5 years of industry experience in advanced DFx techniques
  • DFx experience implementing in finFET technologies
  • Experience with industry standard ATPG and DFx insertion CAD tools
  • Familiarity with SystemVerilog and UVM
  • Fluent in RTL coding for DFx logic including lock-up latches, clock gates, and scan anchors
  • Understanding of low-power design flows such as power gating, multi-Vt and voltage scaling
  • Good understanding of high-performance, low-power design fundamentals
  • Knowledge of fault models including Stuck-at, Transition, Gate-Exhaustive, Path Delay, IDDQ, and Cell Aware
  • Strong problem solving and debug skills

Nice to have

  • Exposure to post-silicon testing and tester pattern debug
  • Experience with Fault Campaigns

What the JD emphasized

  • high-performance RISC-V CPU
  • industry leading AI/ML architectures
  • reducing test cost while attaining high coverage
  • facilitating debug and yield learnings while minimizing design intrusions
  • advanced DFx techniques
  • finFET technologies
  • industry standard ATPG and DFx insertion CAD tools
  • Fluent in RTL coding for DFx logic including lock-up latches, clock gates, and scan anchors.
  • high-performance, low-power design fundamentals
  • fault models including Stuck-at, Transition, Gate-Exhaustive, Path Delay, IDDQ, and Cell Aware
  • post-silicon testing and tester pattern debug
  • Fault Campaigns