Staff Product Development Engineer - Ate Content Developer

Tenstorrent · Semiconductors · Santa Clara, CA · Silicon

Develops production test programs for high-performance AI/ML silicon on ATE test platforms, translating DFT/ATPG content into optimized ATE solutions and implementing Streaming Scan Network architectures. Focuses on reducing test cost, optimizing test time for chiplet/multi-die architectures, and enabling yield learning.

What you'd actually do

  1. Develop and optimize production test programs on Advantest V93K using the SmarTest 8 environment, from bring‑up through high‑volume manufacturing.
  2. Translate ATPG patterns (STIL/WGL) into production‑ready test content, balancing test time, coverage, and cost for chiplet and multi‑die AI/ML devices.
  3. Implement and debug Streaming Scan Network (SSN) based content for high‑speed scan delivery, ensuring robust and scalable scan test infrastructure.
  4. Own test content for scan, BIST, and memory test structures, collaborating with DFT teams on pattern debug, fault diagnosis, and coverage improvement.
  5. Support silicon bring‑up and debug in the lab and at manufacturing sites, including correlation, corner characterization, and PVT studies.

Skills

Required

  • Semiconductor test engineering
  • ATE test platforms (Advantest V93K, Teradyne UltraFlex+)
  • DFT/ATPG flows
  • Scan chains, MBIST, compression, JTAG/IEEE 1149.1
  • Fault models (stuck-at, transition, path delay, cell-aware)
  • C/C++ or Java
  • Python, Perl, or TCL scripting
  • ATE hardware debugging
  • Data analysis for yield improvement
  • STDF analytics

Nice to have

  • Chiplet and multi-die architectures
  • Streaming Scan Network (SSN)
  • 2.5D/3D packaging
  • HBM integration
  • High-speed scan delivery
  • Next-generation DFT/test methodologies

What the JD emphasized

  • 7 years and a BS/MS in EE/ECE/CE and a track record testing complex digital devices on advanced nodes
  • Hands-on with Advantest V93K and/or Teradyne UltraFlex+ platforms, comfortable owning production test programs end‑to‑end
  • Deeply familiar with DFT/ATPG flows and test architectures: scan chains, MBIST, compression, JTAG/IEEE 1149.1, and common fault models (stuck‑at, transition, path delay, cell‑aware)
  • Proficient in C/C++ or Java, with strong scripting skills in Python, Perl, or TCL to automate flows, pattern handling, and data analysis
  • Skilled at debugging across ATE hardware, test programs, and silicon, and at using data to drive root‑cause analysis and yield improvement
  • eligible to access U.S. export-controlled technology